5.8 KiB
| title | chunk | source | category | tags | date_saved | instance |
|---|---|---|---|---|---|---|
| Atomic force microscopy | 5/9 | https://en.wikipedia.org/wiki/Atomic_force_microscopy | reference | science, encyclopedia | 2026-05-05T10:03:47.482245+00:00 | kb-cron |
=== Topographic image of FM-AFM === When the distance between the probe and the sample is brought to the range where atomic force may be detected, while a cantilever is excited in its natural eigenfrequency (f0), the resonance frequency f of the cantilever may shift from its original resonance frequency. In other words, in the range where atomic force may be detected, a frequency shift (df =f–f0) will also be observed. When the distance between the probe and the sample is in the non-contact region, the frequency shift increases in negative direction as the distance between the probe and the sample gets smaller. When the sample has concavity and convexity, the distance between the tip-apex and the sample varies in accordance with the concavity and convexity accompanied with a scan of the sample along x–y direction (without height regulation in z-direction). As a result, the frequency shift arises. The image in which the values of the frequency obtained by a raster scan along the x–y direction of the sample surface are plotted against the x–y coordination of each measurement point is called a constant-height image. On the other hand, the df may be kept constant by moving the probe upward and downward (See (3) of FIG.5) in z-direction using a negative feedback (by using z-feedback loop) while the raster scan of the sample surface along the x–y direction. The image in which the amounts of the negative feedback (the moving distance of the probe upward and downward in z-direction) are plotted against the x–y coordination of each measurement point is a topographic image. In other words, the topographic image is a trace of the tip of the probe regulated so that the df is constant and it may also be considered to be a plot of a constant-height surface of the df. Therefore, the topographic image of the AFM is not the exact surface morphology itself, but actually the image influenced by the bond-order between the probe and the sample, however, the topographic image of the AFM is considered to reflect the geographical shape of the surface more than the topographic image of a scanning tunnel microscope.
== Force spectroscopy == Besides imaging, AFM can be used for force spectroscopy, the direct measurement of tip-sample interaction forces as a function of the gap between the tip and sample. The result of this measurement is called a force-distance curve. For this method, the AFM tip is extended towards and retracted from the surface as the deflection of the cantilever is monitored as a function of piezoelectric displacement. These measurements have been used to measure nanoscale contacts, atomic bonding, Van der Waals forces, and Casimir forces, dissolution forces in liquids and single molecule stretching and rupture forces. AFM has also been used to measure, in an aqueous environment, the dispersion force due to polymer adsorbed on the substrate. Forces of the order of a few piconewtons can now be routinely measured with a vertical distance resolution of better than 0.1 nanometers. Force spectroscopy can be performed with either static or dynamic modes. In dynamic modes, information about the cantilever vibration is monitored in addition to the static deflection. Problems with the technique include no direct measurement of the tip-sample separation and the common need for low-stiffness cantilevers, which tend to "snap" to the surface. These problems are not insurmountable. An AFM that directly measures the tip-sample separation has been developed. The snap-in can be reduced by measuring in liquids or by using stiffer cantilevers, but in the latter case a more sensitive deflection sensor is needed. By applying a small dither to the tip, the stiffness (force gradient) of the bond can be measured as well.
=== Biological applications and other === Force spectroscopy is used in biophysics to measure the mechanical properties of living material (such as tissue or cells) or detect structures of different stiffness buried into the bulk of the sample using the stiffness tomography. Another application was to measure the interaction forces between from one hand a material stuck on the tip of the cantilever, and from another hand the surface of particles either free or occupied by the same material. From the adhesion force distribution curve, a mean value of the forces has been derived. It allowed to make a cartography of the surface of the particles, covered or not by the material. AFM has also been used for mechanically unfolding proteins. In such experiments, the analyzes of the mean unfolding forces with the appropriate model leads to the obtainment of the information about the unfolding rate and free energy profile parameters of the protein.
== Identification of individual surface atoms == The AFM can be used to image atoms and structures on a variety of surfaces. The atom at the apex of the tip "senses" individual atoms on the underlying surface when it begins the formation of chemical bonds with each atom. Because these chemical interactions subtly alter the tip's vibration frequency, they can be detected and mapped. This principle was used to distinguish between atoms of silicon, tin and lead on an alloy surface, by comparing these atomic fingerprints with values obtained from density functional theory (DFT) simulations. Interaction forces must be measured precisely for each type of atom expected in the sample, and then to compare with forces given by DFT simulations. It was found that the tip interacted most strongly with silicon atoms, and interacted 24% and 41% less strongly with tin and lead atoms, respectively. Each different type of atom could be identified in the matrix as the tip using this information.