4.7 KiB
| title | chunk | source | category | tags | date_saved | instance |
|---|---|---|---|---|---|---|
| Atomic force microscopy | 9/9 | https://en.wikipedia.org/wiki/Atomic_force_microscopy | reference | science, encyclopedia | 2026-05-05T10:03:47.482245+00:00 | kb-cron |
AFM images can also be affected by nonlinearity, hysteresis, and creep of the piezoelectric material and cross-talk between the x, y, z axes that may require software enhancement and filtering. Such filtering could "flatten" out real topographical features. However, newer AFMs utilize real-time correction software (for example, feature-oriented scanning) or closed-loop scanners, which practically eliminate these problems. Some AFMs also use separated orthogonal scanners (as opposed to a single tube), which also serve to eliminate part of the cross-talk problems. As with any other imaging technique, there is the possibility of image artifacts, which could be induced by an unsuitable tip, a poor operating environment, or even by the sample itself, as depicted on the right. These image artifacts are unavoidable; however, their occurrence and effect on results can be reduced through various methods. Artifacts resulting from a too-coarse tip can be caused for example by inappropriate handling or de facto collisions with the sample by either scanning too fast or having an unreasonably rough surface, causing actual wearing of the tip. Due to the nature of AFM probes, they cannot normally measure steep walls or overhangs. Specially made cantilevers and AFMs can be used to modulate the probe sideways as well as up and down (as with dynamic contact and non-contact modes) to measure sidewalls, at the cost of more expensive cantilevers, lower lateral resolution and additional artifacts.
== Other applications in various fields of study ==
The latest efforts in integrating nanotechnology and biological research have been successful and show much promise for the future, including in fields such as nanobiomechanics. Since nanoparticles are a potential vehicle of drug delivery, the biological responses of cells to these nanoparticles are continuously being explored to optimize their efficacy and how their design could be improved. Pyrgiotakis et al. were able to study the interaction between CeO2 and Fe2O3 engineered nanoparticles and cells by attaching the engineered nanoparticles to the AFM tip. Studies have taken advantage of AFM to obtain further information on the behavior of live cells in biological media. Real-time atomic force spectroscopy (or nanoscopy) and dynamic atomic force spectroscopy have been used to study live cells and membrane proteins and their dynamic behavior at high resolution, on the nanoscale. Imaging and obtaining information on the topography and the properties of the cells has also given insight into chemical processes and mechanisms that occur through cell-cell interaction and interactions with other signaling molecules (ex. ligands). Evans and Calderwood used single cell force microscopy to study cell adhesion forces, bond kinetics/dynamic bond strength and its role in chemical processes such as cell signaling. Scheuring, Lévy, and Rigaud reviewed studies in which AFM to explore the crystal structure of membrane proteins of photosynthetic bacteria. Alsteen et al. have used AFM-based nanoscopy to perform a real-time analysis of the interaction between live mycobacteria and antimycobacterial drugs (specifically isoniazid, ethionamide, ethambutol, and streptomycine), which serves as an example of the more in-depth analysis of pathogen-drug interactions that can be done through AFM.
== See also == Science portal
== References ==
== Further reading == Voigtländer, Bert (2019). Atomic Force Microscopy. NanoScience and Technology. Springer. Bibcode:2019afm..book.....V. doi:10.1007/978-3-030-13654-3. ISBN 978-3-030-13653-6. S2CID 199490753. Carpick, Robert W.; Salmeron, Miquel (1997). "Scratching the Surface: Fundamental Investigations of Tribology with Atomic Force Microscopy". Chemical Reviews. 97 (4): 1163–1194. doi:10.1021/cr960068q. ISSN 0009-2665. PMID 11851446. Giessibl, Franz J. (2003). "Advances in atomic force microscopy". Reviews of Modern Physics. 75 (3): 949–983. arXiv:cond-mat/0305119. Bibcode:2003RvMP...75..949G. doi:10.1103/RevModPhys.75.949. ISSN 0034-6861. S2CID 18924292. Garcia, Ricardo; Knoll, Armin; Riedo, Elisa (2014). "Advanced Scanning Probe Lithography". Nature Nanotechnology. 9 (8): 577–87. arXiv:1505.01260. Bibcode:2014NatNa...9..577G. doi:10.1038/NNANO.2014.157. PMID 25091447. S2CID 205450948. García, Ricardo; Pérez, Rubén (2002). "Dynamic atomic force microscopy methods". Surface Science Reports. 47 (6–8): 197–301. Bibcode:2002SurSR..47..197G. doi:10.1016/S0167-5729(02)00077-8.
== External links == The Inner Workings of an AFM - An Animated Explanation WeCanFigureThisOut.org